The text covers the background required for the analysis of the measurements and the standards employed to calibrate radiofrequency and microwave radiometers. It also covers measurements of noise temperature (power) and the noise characteristics of amplifiers and transistors. In addition to the usual room-temperature two-port devices, cryogenic devices and multiport amplifiers are also discussed. Finally, the connection of these lab-based measurements to remote-sensing measurement (especially from space) is considered, and possible contributions of the lab-based measurements to remote-sensing applications are discussed.
Specific topics and concepts covered in the text include:
Noise-temperature standards, covering ambient standards, hot (oven) standards, cryogenic standards, and other standards and noise sourcesAmplifier noise, covering definition of noise parameters, measurement of noise parameters, uncertainty analysis for noise-parameter measurements, and simulations and strategiesOn-wafer noise measurements, covering on-wafer microwave formalism, noise temperature, on-wafer noise-parameter measurements, and uncertaintiesMultiport amplifiers, covering formalism and noise matrix, definition of noise figure for multiports, and degradation of signal-to-noise ratio
Containing some introductory material, Precision Measurement of Microwave Thermal Noise is an invaluable resource on the subject for advanced students and all professionals working in (or entering) the field of microwave noise measurements, be it in a standards lab, a commercial lab, or academic research.

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